Limited Access Testing of Analog Circuits: Handling Tolerances

Authors:
Cherif Ahrikencheikh;Michael Spears
Affiliations:
-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

Citing 3
Cited 1

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Abstract

This paper deals with in-circuit testing of analog circuitsthat have limited access. A new method to account fortolerances on device values is presented, with resultsillustrating good performance in a production testenvironment.