A Probe Scheduling Algorithm for MCM Substrates

Authors:
Bruce C. Kim;Pinshan Jiang;Se Hyun Park
Affiliations:
-;-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

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Abstract

In this paper we propose an efficient algorithm forscheduling a flying test probe for unpopulated multi-chipmodule (MCM) substrates. Our objective is to reduce thetotal time of MCM substrate testing by optimizing the travelingpath of the probe. This paper first describes twoalgorithms: Lin-Kernighan (LK) and Simulated Annealing(SA). We then discuss our proposed algorithm which is thecombination of SA and LK to optimize scheduling of theflying test probe. The algorithm is based on the single-endedprobe testing method. We applied the algorithms toa real MCM substrate and obtained satisfactory low-costresults.