Test Process Optimization: Closing The Gap In The Defect Spectrum

Authors:
Norma Barrett;Simon Martin;Chryssa Dislis
Affiliations:
-;-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

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Abstract

This paper describes our methodology of tuning the testprocess of the Motorola Operations and MaintenanceCenter (OMC) product to systematically reduce fielddefects. The benefits include improved test cases, reduceddefects and the availability of up to date field data forfeature verification.