A signal-processing framework for reflection
ACM Transactions on Graphics (TOG)
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We present a framework for calculating low-dimensional bases torepresent image irradiance from surfaces with isotropic reflectanceunder arbitrary illumination. By representing the illumination andthe bidirectional reflectance distribution function (BRDF) infrequency space, a model for the image irradiance is derived. Thismodel is then reduced in dimensionality by analyticallyconstructing the principal component basis for all images given thevariations in both the illumination and the surface material. Theprincipal component basis are constructed in such a way that allthe symmetries (Helmholtz reciprocity and isotropy) of the BRDF arepreserved in the basis functions. Using the framework we calculatea basis using a database of natural illumination and the CURETdatabase containing BRDFs of real world surface materials.