Implications of test-driven development: a pilot study

  • Authors:
  • Reid Kaufmann;David Janzen

  • Affiliations:
  • Sun Microsystems, Inc., Wichita, KS;Bethel College, North Newton, KS

  • Venue:
  • OOPSLA '03 Companion of the 18th annual ACM SIGPLAN conference on Object-oriented programming, systems, languages, and applications
  • Year:
  • 2003

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Abstract

A Spring 2003 experiment examines the claims that test-driven development or test-first programming improves software quality and programmer confidence. The results indicate support for these claims and inform larger future experiments.