Detecting pattern-based outliers

  • Authors:
  • Tianming Hu;Sam Y. Sung

  • Affiliations:
  • Department of Computer Science, National University of Singapore, Singapore 117543, Singapore;Department of Computer Science, National University of Singapore, Singapore 117543, Singapore

  • Venue:
  • Pattern Recognition Letters
  • Year:
  • 2003

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Abstract

Outlier detection targets those exceptional data that deviate from the general pattern. Besides high density clustering, there is another pattern called low density regularity. Thus, there are two types of outliers w.r.t. them. We propose two techniques: one to identify the two patterns and the other to detect the corresponding outliers.