Defect tracking and reliability modeling for a new product release

  • Authors:

  • Shanker Sanyal;Ken Aida;Kostas Gaitanos;George Wowk;Sam Lahiri

  • Affiliations:

  • IBM Canada Limited Laboratory, North York, Ontario, Canada;IBM Canada Limited Laboratory, North York, Ontario, Canada;IBM Canada Limited Laboratory, North York, Ontario, Canada;IBM Canada Limited Laboratory, North York, Ontario, Canada;IBM Canada Limited Laboratory, North York, Ontario, Canada

  • Venue:
  • CASCON '92 Proceedings of the 1992 conference of the Centre for Advanced Studies on Collaborative research - Volume 1
  • Year:
  • 1992

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Abstract

One of the indicators of success in the area of delivering quality software is the number of defects reported by the customer following product ship. Consequently, this necessitates a process for tracking defects in the development and testing phases. The consequent to defect arrival patterns can then be used to provide flags requiring changes in the development process, and to project the likely number of customer reported problems once the product goes out of the door.This report describes the methods used for tracking defects and for using reliability growth models to project the number of customer reported defects for a new product release. The methods used for extracting, depicting, analyzing, and modeling defect data are described in detail.Defects were tracked using the Configuration Management Version Control tool (CMVC), with the defect data extracted on a weekly basis. The defect arrival rate was then used to project the number of expected customer reported defects using a reliability projection tool.