View planning for BRDF acquisition

Authors:
Jochen Lang;Hans-Peter Seidel;Hendrik P. A. Lensch
Affiliations:
MPI Informatik, Saarbrücken, Germany;MPI Informatik, Saarbrücken, Germany;MPI Informatik, Saarbrücken, Germany
Venue:
ACM SIGGRAPH 2003 Sketches & Applications
Year:
2003

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Abstract

The estimation of the bi-directional reflectance distribution function (BRDF) of a 3D object requires reflectance measurements under numerous viewing and lighting directions. This sketch summarizes our method to select advantageous directions. Uncertainty minimization of the estimated BRDF parameters forms the theoretical underpinning of our acquisition planner. Our hardware-accelerated planner can aid manual and automatic measurement, reduces measurement effort and increases the quality of the acquired models.