An analysis and approach to using existing ontological systems for applications in manufacturing

  • Authors:

  • Craig Schlenoff;Peter Denno;Rob Ivester;Don Libes;Simon Szykman

  • Affiliations:

  • National Institute of Standards and Technology, Gaithersburg, MD 20899;National Institute of Standards and Technology, Gaithersburg, MD 20899;National Institute of Standards and Technology, Gaithersburg, MD 20899;National Institute of Standards and Technology, Gaithersburg, MD 20899;National Institute of Standards and Technology, Gaithersburg, MD 20899

  • Venue:
  • Artificial Intelligence for Engineering Design, Analysis and Manufacturing
  • Year:
  • 2000

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Abstract

This paper reports on the results of an analysis of existing ontological systems to determine which is most appropriate for the manufacturing domain. In particular, this involved the exploration of efforts that are studying both the uses of ontologies in the general sense and those that are using ontologies for domain-specific purposes. Eleven ontological systems were analyzed and, using a set of analysis criteria, it was determined that the Cyc (Cyc is a registered trademark of Cycorp Inc.) system was most appropriate for modeling concepts in the manufacturing domain. After the analysis is described, examples are given to show how manufacturing concepts could be modeled in the Cyc system. This work is part of a larger project whose objective is to move closer to the ultimate goal of seamless manufacturing systems integration using the principle behind ontological engineering to unambiguously define domain-specific concepts. The output of this work will be a taxonomy of manufacturing terms and concepts along with formal definitions of exactly what each of those terms and concepts mean and how they interrelate.