Material grain noise analysis by using higher-order statistics

  • Authors:
  • Ramón Miralles;Luis Vergara;Jorge Gosalbez

  • Affiliations:
  • Departamento de Communicaciones, Universidad Politecnica de Valencia, Cno. de Vera s/n, Valencia 46022, Spain;Departamento de Communicaciones, Universidad Politecnica de Valencia, Cno. de Vera s/n, Valencia 46022, Spain;Departamento de Communicaciones, Universidad Politecnica de Valencia, Cno. de Vera s/n, Valencia 46022, Spain

  • Venue:
  • Signal Processing
  • Year:
  • 2004

Quantified Score

Hi-index 0.08

Visualization

Abstract

We have derived equations relating to the cumulants of the backscattered signal to material and transducer parameters. Then, we proposed a practical method to estimate the material grain moments from estimates of the cumulants at some particular values. The proposed model and techniques are verified on some phantoms having different scatterer density and grain sizes.