Extended Subspace Identification of Improper Linear Systems

Authors:
Gerd Vandersteen;Rik Pintelon;Dimitri Linten;Stéphane Donnay
Affiliations:
-;-;-;-
Venue:
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Year:
2004

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Abstract

The modeling of linear transfer functions is often required prior to the simulation of electronic systems. An example is the modeling of on-chip inductors starting from 2-port measurements. The modeling is often done using state-space models that can only represent proper systems.This leads to modeling problems in the case of improper systems such as in the case of 2-port modeling of the admittance matrix of an on-chip inductor. This paper first describes an extended state-space model to represent improper systems. Afterwards, the paper introduces an extension to classical frequency-domain subspace identification methods. The usefulness of both the extended state-space model and the extended subspace modeling technique are illustrated by comparing them with commercially available solutions. This includes a comparison on measurements of an on-chip inductor and on simulations of a coplanar waveguide.