Multiple-output parity BIT signature for exhaustive testing

Authors:
W. B. Jone;S. R. Das
Affiliations:
-;-
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1990

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Fault tolerant systems design in VLSI using data compression under constraints of failure probabilities: overview and status

CIMMACS'07 Proceedings of the 6th WSEAS international conference on Computational intelligence, man-machine systems and cybernetics

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Abstract