Defect Oriented Testing of Analog Circuits Using Wavelet Analysis of Dynamic Supply Current
Journal of Electronic Testing: Theory and Applications
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Wavelet transform has the property of resolving signal in both time and frequency unlike Fourier transform. In this work, we show that time-domain information obtained from wavelet analysis of supply current can be used to efficiently test the frequency specification of analog filters. The pole/zero locations in the frequency response of analog filters shift due to change in component values with process variations. It is essential to test the filters for the shift infrequency response and fix it, during production test. Wavelet analysis of supply current can be a promising alternative to test frequency specification of analog filters, since it needs only one ac stimulus and is virtually unaffected by transistor threshold variation. Simulation results on two test circuits demonstrate that we can estimate pole/zero shift with less than 3% error using only one measurement, which requires about 18 measurements in the conventional technique.