Parameter estimation of a real single tone from short data records

  • Authors:
  • H. W. Fung;Alex C. Kot;K. H. Li;K. C. Teh

  • Affiliations:
  • Institute for Infocomm Research, 21 Heng Mui Keng Terrace, Singapore 119613, Singapore;School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore;School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore;School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Singapore

  • Venue:
  • Signal Processing
  • Year:
  • 2004

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Abstract

A new technique is presented in this paper for real single tone parameter estimation at a low computational cost based on the development of a two-bin estimator, and its extension to efficient multiple-bin estimators. The proposed approach has no constraint on the number and ordering of the discrete Fourier transform bins it operates on, and a means of tradeoff for parameter accuracy with computational complexity is hence provided. Simulation results show its achievement of a low variance close to the Cramer-Rao bounds, and that essentially unbiased parameter estimates are obtained. The inherent capabilities of the design in handling short data records and low-frequency signals allow its applications to a wide class of problems.