Analyzing cycle stealing on synchronous circuits with level-sensitive latches
DAC '92 Proceedings of the 29th ACM/IEEE Design Automation Conference
Fast statistical timing analysis by probabilistic event propagation
Proceedings of the 38th annual Design Automation Conference
Closed form solutions to simultaneous buffer insertion/sizing and wire sizing
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
Concurrent flip-flop and repeater insertion for high performance integrated circuits
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Repeater insertion and wire sizing optimization for throughput-centric VLSI global interconnects
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
A New Statistical Approach to Timing Analysis of VLSI Circuits
VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Methodologies and Tools for Pipelined On-Chip Interconnect
ICCD '02 Proceedings of the 2002 IEEE International Conference on Computer Design: VLSI in Computers and Processors (ICCD'02)
Interconnect Effort - A Unification of Repeater Insertion and Logical Effort
ISVLSI '03 Proceedings of the IEEE Computer Society Annual Symposium on VLSI (ISVLSI'03)
Flip-Flop and Repeater Insertion for Early Interconnect Planning
Proceedings of the conference on Design, automation and test in Europe
Block-based Static Timing Analysis with Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
"AU: Timing Analysis Under Uncertainty
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Statistical Timing Analysis Considering Spatial Correlations using a Single Pert-Like Traversal
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Experience in critical path selection for deep sub-micron delay test and timing validation
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Statistical timing analysis using bounds and selective enumeration
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A probabilistic analysis of pipelined global interconnect under process variations
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Simultaneous Statistical Delay and Slew Optimization for Interconnect Pipelines
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the 2008 international workshop on System level interconnect prediction
Latch modeling for statistical timing analysis
Proceedings of the conference on Design, automation and test in Europe
Estimating reliability and throughput of source-synchronous wave-pipelined interconnect
NOCS '09 Proceedings of the 2009 3rd ACM/IEEE International Symposium on Networks-on-Chip
Computation of joint timing yield of sequential networks considering process variations
PATMOS'07 Proceedings of the 17th international conference on Integrated Circuit and System Design: power and timing modeling, optimization and simulation
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With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, a novel statistical timing analysis approach has been developed to analyze the behavior of two important pipelined architectures for multiple clock-cycle global interconnect, namely, the flip-flop inserted global wire and the latch inserted global wire. We present analytical formula that is based on parameters obtained using Monte Carlo simulation. These results enable a global interconnect designer to explore design trade-offs between clock frequency and probability of bit-error during data transmission.