Covering arrays for efficient fault characterization in complex configuration spaces

  • Authors:

  • Cemal Yilmaz;Myra B. Cohen;Adam Porter

  • Affiliations:

  • University of Maryland, College Park, Maryland;University of Auckland, Auckland, New Zealand;University of Maryland, College Park, Maryland

  • Venue:
  • ISSTA '04 Proceedings of the 2004 ACM SIGSOFT international symposium on Software testing and analysis
  • Year:
  • 2004

Quantified Score

Hi-index 0.00

Visualization

Abstract

Testing systems with large configurations spaces that change often is a challenging problem. The cost and complexity of QA explodes because often there isn't just one system, but a multitude of related systems. Bugs may appear in certain configurations, but not in others.The Skoll system and process has been developed to test these types of systems through distributed, continuous quality assurance, leveraging user resources around-the-world, around-the-clock. It has been shown to be effective in automatically characterizing configurations in which failures manifest. The derived information helps developers quickly narrow down the cause of failures which then improves turn around time for fixes. However, this method does not scale well. It requires one to exhaustively test each configuration in the configuration space.In this paper we examine an alternative approach. The idea is to systematically sample the configuration space, test only the selected configurations, and conduct fault characterization on the resulting data. The sampling approach we use is based on calculating a mathematical object called a covering array. We empirically assess the effect of using covering array derived test schedules on the resulting fault characterizations and provide guidelines to practitioners for their use.