Probabilistic reasoning in intelligent systems: networks of plausible inference
Probabilistic reasoning in intelligent systems: networks of plausible inference
Dependency preserving probabilistic modeling of switching activity using bayesian networks
Proceedings of the 38th annual Design Automation Conference
Fast statistical timing analysis by probabilistic event propagation
Proceedings of the 38th annual Design Automation Conference
A general probabilistic framework for worst case timing analysis
Proceedings of the 39th annual Design Automation Conference
Proceedings of the 39th annual Design Automation Conference
Bayesian Networks and Decision Graphs
Bayesian Networks and Decision Graphs
Probabilistic Networks and Expert Systems
Probabilistic Networks and Expert Systems
Statistical timing analysis using bounds and selective enumeration
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
From blind certainty to informed uncertainty
Proceedings of the 8th ACM/IEEE international workshop on Timing issues in the specification and synthesis of digital systems
A methodology to improve timing yield in the presence of process variations
Proceedings of the 41st annual Design Automation Conference
Statistical timing analysis based on a timing yield model
Proceedings of the 41st annual Design Automation Conference
Statistical timing analysis in sequential circuit for on-chip global interconnect pipelining
Proceedings of the 41st annual Design Automation Conference
Statistical Timing Analysis with Extended Pseudo-Canonical Timing Model
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Fast interval-valued statistical interconnect modeling and reduction
Proceedings of the 2005 international symposium on Physical design
Proceedings of the 42nd annual Design Automation Conference
Correlation-preserved non-gaussian statistical timing analysis with quadratic timing model
Proceedings of the 42nd annual Design Automation Conference
Proceedings of the 42nd annual Design Automation Conference
Interval-valued reduced order statistical interconnect modeling
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Efficient statistical timing analysis through error budgeting
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Clock schedule verification under process variations
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Block based statistical timing analysis with extended canonical timing model
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Advances in Computation of the Maximum of a Set of Random Variables
ISQED '06 Proceedings of the 7th International Symposium on Quality Electronic Design
Statistical timing analysis with two-sided constraints
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
A unified framework for statistical timing analysis with coupling and multiple input switching
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Statistical timing analysis with path reconvergence and spatial correlations
Proceedings of the conference on Design, automation and test in Europe: Proceedings
A new statistical max operation for propagating skewness in statistical timing analysis
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
Digital Circuit Optimization via Geometric Programming
Operations Research
Efficient computation of the worst-delay corner
Proceedings of the conference on Design, automation and test in Europe
Breaking the simulation barrier: SRAM evaluation through norm minimization
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
Proceedings of the 2009 International Conference on Computer-Aided Design
Effective corner-based techniques for variation-aware IC timing verification
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Probabilistic error modeling for nano-domain logic circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Due to excessive reduction in the gate length, dopant concentrationsand the oxide thickness, even the slightest of variations inthese quantities can result in significant variations in the performanceof a device. This has resulted in a need for efficient andaccurate techniques for performing Statistical Analysis of circuits.In this paper we propose a methodology based on Bayesian Networksfor computing the exact probability distribution of the delayof a circuit. In case of large circuits where it is not possible tocompute the exact distribution, we propose methods to reduce theproblem size and get a tight lower bound on the exact distribution.