Comparing the Fault Detection Effectiveness of N-way and Random Test Suites

Authors:
Patrick J. Schroeder;Pankaj Bolaki;Vijayram Gopu
Affiliations:
University of Wisconsin - Milwaukee;University of Wisconsin - Milwaukee;University of Wisconsin - Milwaukee
Venue:
ISESE '04 Proceedings of the 2004 International Symposium on Empirical Software Engineering
Year:
2004

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