RF-BIST: Loopback Spectral Signature Analysis

  • Authors:
  • Doris Lupea;Udo Pursche;Hans-Joachim Jentschel

  • Affiliations:
  • Technische UniversitäT Dresden;Technische UniversitäT Dresden;Technische UniversitäT Dresden

  • Venue:
  • DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
  • Year:
  • 2003

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Abstract

Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature Analysis at system level seems to be a promising concept. Investigations that have been carried out are targeted on the most challenging problems: Generation of the Test Signature, Evaluation of the Signature Response, Implementation of the concept and Verification by Simulation. From investigations it can be concluded that the concept is suitable especially in the case of transceiver-type DUT.