Duality method for limit analysis of dielectrics in powerful electric fields

  • Authors:

  • Igor A. Brigadnov

  • Affiliations:

  • Department of Computer Science, North-Western State Technical University, Millionnaya 5, St, Petersburg 191186, Russia

  • Venue:
  • Journal of Computational and Applied Mathematics - Special issue: Selected papers from the 2nd international conference on advanced computational methods in engineering (ACOMEN2002) Liege University, Belgium, 27-31 May 2002
  • Year:
  • 2004

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Abstract

The limit analysis problem (LAP) for the estimation of electric durability for a dielectric in a powerful electric field is examined. The appropriate dual problem is formulated. After the standard piecewise linear continuous finite-element approximation, the dual LAP is transformed into the problem of mathematical programming with linear limitations as equalities. This finite dimension problem is effectively solved by the standard method of gradient projection.