Interprocedural slicing using dependence graphs
ACM Transactions on Programming Languages and Systems (TOPLAS)
The use of program profiling for software maintenance with applications to the year 2000 problem
ESEC '97/FSE-5 Proceedings of the 6th European SOFTWARE ENGINEERING conference held jointly with the 5th ACM SIGSOFT international symposium on Foundations of software engineering
Simplifying failure-inducing input
Proceedings of the 2000 ACM SIGSOFT international symposium on Software testing and analysis
Simplifying and Isolating Failure-Inducing Input
IEEE Transactions on Software Engineering
Visualization of test information to assist fault localization
Proceedings of the 24th International Conference on Software Engineering
ConSIT: A Conditioned Program Slicer
ICSM '00 Proceedings of the International Conference on Software Maintenance (ICSM'00)
IEEE Transactions on Software Engineering
Penumbra: automatically identifying failure-relevant inputs using dynamic tainting
Proceedings of the eighteenth international symposium on Software testing and analysis
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We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.