A Statistical Model to Locate Faults at Input Level

  • Authors:
  • Wu Ji;Jia Xiao-xia;Liu Chang;Yang Hai-yan;Liu Chao;Jin Mao-zhong

  • Affiliations:
  • Beijing University of Aeronautics and Astronautics, Beijing, China;Beijing University of Aeronautics and Astronautics, Beijing, China;Beijing University of Aeronautics and Astronautics, Beijing, China;Beijing University of Aeronautics and Astronautics, Beijing, China;Beijing University of Aeronautics and Astronautics, Beijing, China;Beijing University of Aeronautics and Astronautics, Beijing, China

  • Venue:
  • Proceedings of the 19th IEEE international conference on Automated software engineering
  • Year:
  • 2004

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Abstract

We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.