Storage Device Performance Prediction with CART Models

  • Authors:
  • Mengzhi Wang;Kinman Au;Anastassia Ailamaki;Anthony Brockwell;Christos Faloutsos;Gregory R. Ganger

  • Affiliations:
  • Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University;Carnegie Mellon University

  • Venue:
  • MASCOTS '04 Proceedings of the The IEEE Computer Society's 12th Annual International Symposium on Modeling, Analysis, and Simulation of Computer and Telecommunications Systems
  • Year:
  • 2004

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Abstract

Storage device performance prediction is a key element of self-managed storage systems. This work explores the application of a machine learning tool, CART models, to storage device modeling. Our approach predicts a deviceýs performance as a function of input workloads, requiring no knowledge of the device internals. We propose two uses of CART models: one that predicts per-request response times (and then derives aggregate values) and one that predicts aggregate values directly from workload characteristics. After being trained on the device in question, both provide accurate black-box models across a range of test traces from real environments. Experiments show that these models predict the average and 90th percentile response time with a relative error as low as 19%, when the training workloads are similar to the testing workloads, and interpolate well across different workloads.