Mapping-based width measures and uncertainty relations for periodic functions

Authors:
Miguel Angel Alonso;Martin J. Bastiaans
Affiliations:
The Institute of Optics, University of Rochester, Rochester, NY and Universidad Nacional Autónoma de México, Centro de Ciencias Físicas, Apartado Postal 48-3, Cuernavaca Morelos 622 ...;Technische Universiteit Eindhoven, Faculteit Elektrotechniek, Postbus 513, 5600 MB Eindhoven, Netherlands
Venue:
Signal Processing
Year:
2004

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Abstract

Measures for the width of a periodic function are discussed, based on five different mappings of a (periodic) function on a circle to a (non-periodic) function on a line or line segment. The uncertainty relations corresponding to these measures are also obtained by using a generalization of the Cauchy-Schwarz inequality.