Scene-Adapted Structured Light

  • Authors:

  • Thomas P. Koninckx;Pieter Peers;Philip Dutre;Luc Van Gool

  • Affiliations:

  • Katholieke Universiteit Leuven;Katholieke Universiteit Leuven;Katholieke Universiteit Leuven;Katholieke Universiteit Leuven and Swiss Federal Institute of Technology

  • Venue:
  • CVPR '05 Proceedings of the 2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05) - Volume 2 - Volume 02
  • Year:
  • 2005

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Abstract

In order to overcome several limitations of structured light 3D acquisition methods, the colors, intensities, and shapes of the projected patterns are adapted to the scene. Based on a crude estimate of the scene geometry and reflectance characteristics, the local intensity ranges in the projected patterns are adapted, in order to avoid over- and under-exposure in the image. This avoids the infamous specularity problems and generally increases accuracy. The estimated geometry also helps to limit the effect of aliasing caused by the sampling of foreshortened patterns. Furthermore, the approach also acounts for the adverse effects that small motions during scanning would normally have. Moreover, the approach yields a confidence measure at every pixel of the range image. Last but not least, the scanner consists of consumer products only, and therefore is cheap.