GE NLTooLSET: MUC-3 test results and analysis

Authors:
George Krupka;Lucja Iwańska;Paul Jacobs;Lisa Rau
Affiliations:
GE Research and Development, Schenectady, NY;GE Research and Development, Schenectady, NY;GE Research and Development, Schenectady, NY;GE Research and Development, Schenectady, NY
Venue:
MUC3 '91 Proceedings of the 3rd conference on Message understanding
Year:
1991

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Abstract

This paper reports on the GE NLTooLSET customization effort for MUC-3, and analyzes the results of the TST2 run. Although our own tests had shown steady improvement between TST1 and TST2, our official scores on TST2 were lower than on TST1. The analysis of this unexpected result explains some of the details of the MUC-3 test, and we propose ways of looking at the scores to distinguish different aspects of system performance.