Locating where faults will be

Authors:
Thomas J. Ostrand;Elaine J. Weyuker;Robert M. Bell
Affiliations:
AT&T Labs - Research, Florham Park, NJ;AT&T Labs - Research, Florham Park, NJ;AT&T Labs - Research, Florham Park, NJ
Venue:
Proceedings of the 2005 conference on Diversity in computing
Year:
2005

Citing 3
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Abstract