Probabilistic optimization and assessment of voting strategies for X-by-wire systems
SEUS'07 Proceedings of the 5th IFIP WG 10.2 international conference on Software technologies for embedded and ubiquitous systems
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As feature sizes continue to decrease and clock rates and device count on a VLSI chip increase, it becomes increasingly more difficult to maintain yields at their present levels. Process variation, noise and spot defects create very costly problems for ...