IEEE Transactions on Pattern Analysis and Machine Intelligence
Statistical Pattern Recognition: A Review
IEEE Transactions on Pattern Analysis and Machine Intelligence
Perceptual Metrics for Image Database Navigation
Perceptual Metrics for Image Database Navigation
GREC'05 Proceedings of the 6th international conference on Graphics Recognition: ten Years Review and Future Perspectives
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This paper presents a novel approach to combine shape descriptors. Each approach is applied on several clusters of objects. For each cluster and for any descriptor a map is associated directly from the confusion matrix. Such a method allows to determine automatically the better weight associated to the descriptor for the object under consideration. At last, we show that the additive combination of such measures allows to improve the classification.