Emerging Techniques for Test Data Compression

  • Authors:

  • Kedarnath J. Balakrishnan

  • Affiliations:

  • NEC Laboratories America, Princeton, NJ

  • Venue:
  • ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
  • Year:
  • 2005

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Abstract

Increasing test costs has been one of the disadvantageous consequences of technology scaling especially in deep sub-micron designs. The amount of test data required to achieve good test quality has increased tremendously due to the increasing complexity of devices as well as the need to test for newer defect mechanisms that are becoming predominant in smaller device geometries. This has led to the development and deployment of new Design-for-Test (DFT) technologies to mitigate the problem.