Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time

Authors:
C. Taillefer;G. W. Roberts
Affiliations:
McGill University, Canada;McGill University, Canada
Venue:
ITC '04 Proceedings of the International Test Conference on International Test Conference
Year:
2004

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Abstract

Noise, especially clock jitter effects, in a DSPbased mixed-signal test system severely limits its measurement accuracy. This is especially acute in high-frequency sampling systems. This paper illustrates an efficient method to improve measurement accuracy and precision by reducing the uncertainty of a DSP-based measurement without an increase in test time. A new digitizer architecture is introduced. The digitizer was fabricated in a 0.18 ìm CMOS process. Experimental results were obtained validating the proposed technique.