Proceedings of the 24th annual international symposium on Computer architecture
Transient fault detection via simultaneous multithreading
Proceedings of the 27th annual international symposium on Computer architecture
AR-SMT: A Microarchitectural Approach to Fault Tolerance in Microprocessors
FTCS '99 Proceedings of the Twenty-Ninth Annual International Symposium on Fault-Tolerant Computing
Proceedings of the 36th annual IEEE/ACM International Symposium on Microarchitecture
Techniques to Reduce the Soft Error Rate of a High-Performance Microprocessor
Proceedings of the 31st annual international symposium on Computer architecture
Proceedings of the 31st annual international symposium on Computer architecture
Opportunistic Transient-Fault Detection
Proceedings of the 32nd annual international symposium on Computer Architecture
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CMOS scaling continues to enable faster transistors and lower supply voltage, improving microprocessor performance and reducing per-transistor power. The downside of scaling is increased susceptibility to soft errors due to strikes by cosmic particles and radiation from packaging materials. The result is degraded reliability in future commodity microprocessors. The authors target better coverage while incurring minimal performance degradation by opportunistically using redundancy.