Recent developments in ESD protection for RF ICs

  • Authors:

  • Albert Wang

  • Affiliations:

  • Illinois Institute of Technology, Chicago, IL

  • Venue:
  • ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
  • Year:
  • 2003

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Abstract

New challenge in ESD protection design for RF ICs is to address the complex interactions between the ESD protection network and the core circuit being protected in both directions. This paper reviews recent developments in RF ESD protection design, including switching and mis-triggering of ESD protection networks; ESD-induced parasitic capacitive, resistive, noise coupling and self-generated noise effects; RF ESD evaluation techniques; and low-parasitic compact RF ESD protection solutions.