Integrating Generalized Weibull-type Testing-Effort Function and Multiple Change-Points into Software Reliability Growth Models

  • Authors:
  • Chu-Ti Lin;Chin-Yu Huang;Jun-Ru Chang

  • Affiliations:
  • National Tsing Hua University Hsinchu, Taiwan;National Tsing Hua University Hsinchu, Taiwan;National Tsing Hua University Hsinchu, Taiwan

  • Venue:
  • APSEC '05 Proceedings of the 12th Asia-Pacific Software Engineering Conference
  • Year:
  • 2005

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Abstract

In modern societies, software is everywhere and we need software to be reliable. In practice, during software development processes, software reliability assessment can greatly help managers to understand effectiveness of consumed testing-effort and deploy testing-resource. In the 1970s-2000, many software reliability growth models (SRGMs) have been proposed for estimation of reliability growth of software products. In this paper, the concept of multiple change-points will be incorporated into Weibull-type testing-effort dependent SRGM because the consumption phenomenon of testing resource may vary at some moments. The performance and application of proposed models are demonstrated through one real data set. The experimental results show that the models give an excellence performance on failure prediction. Besides, we'll also discuss the optimal release time problems based on reliability requirement and cost criteria.