Fast Sampling of Implicit Surfaces by Particle Systems

  • Authors:
  • Florian Levet;Xavier Granier;Christophe Schlick

  • Affiliations:
  • University Bordeaux 1, France;University Bordeaux 1, France;University Bordeaux 1, France

  • Venue:
  • SMI '06 Proceedings of the IEEE International Conference on Shape Modeling and Applications 2006
  • Year:
  • 2006

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Abstract

Particle systems, as originally proposed by Witkin and Heckbert [17], are a powerful way to sample implicit surfaces since they generate almost evenly distributed samples over the surface, thanks to a global minimization of an energy criterion. Nonetheless, due to the computational cost of the relaxation process, the sampling process becomes rather expensive when the number of samples exceeds a few thousands. In this paper, we propose a technique that only relies on a pure geometry processing which enables us to rapidly generate the set of final particles (e.g., half a second to generate 5,000 particles for an analytic implicit surface) with nearoptimal positions. Because of its characteristics, the technique does not need the usual split-and-death criterion anymore and only about ten relaxation steps are necessary to get a high quality sampling. Either uniform or non-uniform sampling can be performed with our technique.