Editorial: Special issue for the 5th International Conference on Scale-Space and PDE Methods in Computer Vision
Authors:
Ron Kimmel;Nir Sochen;Joachim Weickert
Affiliations:
Computer Science Department Technion, Haifa, Israel;Department of Applied Mathematics, School of Mathematical Sciences, Tel-Aviv University, Tel Aviv, Israel;Faculty of Mathematics and Computer Science, Saarland University, Saarbrücken, Germany