EVM estimation by analyzing transmitter imperfections mathematically and graphically

Authors:
Ruifeng Liu;Yongming Li;Hongyi Chen;Zhihua Wang
Affiliations:
Institute of Microelectronics, Tsinghua University, Beijing, People's Republic of China 100084;Institute of Microelectronics, Tsinghua University, Beijing, People's Republic of China 100084;Institute of Microelectronics, Tsinghua University, Beijing, People's Republic of China 100084;Institute of Microelectronics, Tsinghua University, Beijing, People's Republic of China 100084
Venue:
Analog Integrated Circuits and Signal Processing
Year:
2006

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Abstract

This letter analyzes the effects of transmitter imperfections, including carrier leakage, unwanted sideband, nonlinearity, local oscillator (LO) phase noise and frequency error, on error vector magnitude (EVM) performance. Predictor equations of transmitter EVM are given for radio designers to estimate the level of EVM or set appropriate design specifications to obtain desired EVM performance. These predictor equations are validated by measurement results of other reported works.