Inspection of 2-D objects using pattern matching method

  • Authors:
  • Min-Hong Han;Joseph Foster;Dongsig Jang

  • Affiliations:
  • Texas A&M Univ., College Station, TX;Texas A&M Univ., College Station, TX;Texas A&M Univ., College Station, TX

  • Venue:
  • Pattern Recognition
  • Year:
  • 1989

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Abstract