Guided model checking with a Bayesian meta-heuristic

Authors:
Kevin Seppi;Michael Jones;Peter Lamborn
Affiliations:
Department of Computer Science, Brigham Young University, Provo, UT;Department of Computer Science, Brigham Young University, Provo, UT;Department of Computer Science, Brigham Young University, Provo, UT
Venue:
Fundamenta Informaticae - Special issue on application of concurrency to system design (ACSD'04)
Year:
2005

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Abstract

This paper presents a meta-heuristic for use in finding errors in models of complex concurrent systems using explicit guided model checking. The meta-heuristic improves explicit guided model checking by applying the empirical Bayes method to revise heuristic estimates of the distance from a given state to an error state. Guided search using the revised estimates finds errors with less search effort than the original estimates.