Online Testing by Protocol Decomposition

  • Authors:
  • Deepali Koppad;Danil Sokolov;Alex Bystrov;Alex Yakovlev

  • Affiliations:
  • University of Newcastle upon Tyne, UK;University of Newcastle upon Tyne, UK;University of Newcastle upon Tyne, UK;University of Newcastle upon Tyne, UK

  • Venue:
  • IOLTS '06 Proceedings of the 12th IEEE International Symposium on On-Line Testing
  • Year:
  • 2006

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Abstract

Like other silicon integrated circuit (IC) domains, the smart card market is very competitive and main actors are constantly trying to design the cheapest and safest circuits to ensure their consumers' satisfaction. These specificities lead smart cards ...