Overlapping variance estimators for simulations

  • Authors:
  • Christos Alexopoulos;David Goldsman;Nilay Tanik Argon;Gamze Tokol

  • Affiliations:
  • Georgia Institute of Technology, Atlanta, GA;Georgia Institute of Technology, Atlanta, GA;University of Wisconsin-Madison, Madison, WI;Decision Analytics, Atlanta, GA

  • Venue:
  • WSC '04 Proceedings of the 36th conference on Winter simulation
  • Year:
  • 2004

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Abstract

We examine properties of overlapped versions of the standardized time series area and Cramér-von Mises estimators for the variance parameter of a stationary stochastic process, e.g., a steady-state simulation output process. We find that the overlapping estimators have the same bias properties as, but lower variance than, their nonoverlapping counterparts; the new estimators also perform well against the benchmark batch means estimator. We illustrate our findings with analytical and Monte Carlo examples.