A framework for standard modular simulation in semiconductor wafer fabrication systems

Authors:
José A. Ramírez-Hernández;Heshan Li;Emmanuel Fernandez;Charles McLean;Swee Leong
Affiliations:
University of Cincinnati, Cincinnati, OH;University of Cincinnati, Cincinnati, OH;University of Cincinnati, Cincinnati, OH;National Institute of Standards and Technology, Gaithersburg, MD;National Institute of Standards and Technology, Gaithersburg, MD
Venue:
WSC '05 Proceedings of the 37th conference on Winter simulation
Year:
2005

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Abstract

This paper presents the application of a framework, proposed by the National Institute of Standards and Technology (NIST), for standard modular simulation in semiconductor wafer fabrication facilities (fabs). The application of the proposed framework resulted in the identification and specification of four different elements in the context of semiconductor fabs: (1) market sector, (2) hierarchical modeling levels, (3) simulation case studies, (4) models and data. An example of the application of the proposed simulation framework to a benchmark semiconductor fab model, the so-called Mini-fab, is presented. In this example, evaluation of production performance under different workforces is studied. Current and future research is focused on the improvement of the proposed framework (e.g., design and testing of generic case studies).