Analyzing and Extending MUMCUT for Fault-based Testing of General Boolean Expressions

Authors:
Chang-ai Sun;Yunwei Dong;R. Lai;K. Y. Sim;T. Y. Chen
Affiliations:
Swinburne University of Technology, Australia;Swinburne University of Technology, Australia;La Trobe University, Australia;Swinburne University of Technology, Malaysia;Swinburne University of Technology, Australia
Venue:
CIT '06 Proceedings of the Sixth IEEE International Conference on Computer and Information Technology
Year:
2006

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Abstract

Boolean expressions are widely used to model decisions or conditions of a specification or source program. The MUMCUT, which is designed to detect seven common faults where Boolean expressions under test are assumed to be in Irredundant Disjunctive Normal Form (IDNF), is an efficient fault-based test case selection strategy in terms of the fault-detection capacity and the size of selected test suite. Following up our previous work that reported the fault-detection capacity of the MUMCUT when it is applied to general form Boolean expressions, in this paper we present the characteristic of the types of single faults committed in general Boolean expressions that a MUMCUT test suite fails to detect, analyze the certainty why a MUMCUT test suite fails to detect these types of undetected faults, and provide some extensions to enhance the detection capacity of the MUMCUT for these types of undetected faults.