Characteristic Line of Planar Homography Matrix and Its Applications in Camera Calibration

  • Authors:
  • Jianhua Wang;Yuncai Liu

  • Affiliations:
  • Shanghai Jiao Tong University;Shanghai Jiao Tong University

  • Venue:
  • ICPR '06 Proceedings of the 18th International Conference on Pattern Recognition - Volume 01
  • Year:
  • 2006

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Abstract

In this paper, we employ the concept of characteristic line to show some useful properties of planar homography matrix. These properties relate the characteristic line of a planar homography matrix with Euler angles of the planar pattern. Based on the characteristic line, a new method of linear camera calibration is proposed and a strategy to select poses of planar pattern during taking calibration images is suggested. This strategy can help ensure accuracy of calibration. Experiment results including both simulated data and real images validate the method and strategy.