Plane metric rectification from a single view of multiple coplanar circles
ICIP'09 Proceedings of the 16th IEEE international conference on Image processing
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This paper presents a new method for planar rectification. The pattern used here contains one circle and two points with known distances to the circle. Partial rectification is introduced to calculate the trace of the mapping centers from each distance constraint. The algorithm is derived by discovering three fixed points during a matrix transformation. Complex coordinates are used to simplify this problem. Our experiments demonstrate that this method achieves good performance.