Combining global and local classifiers with Bayesian network

  • Authors:
  • Leonardo Nogueira Matos;Joao Marques de Carvalho

  • Affiliations:
  • Federal University of Sergipe, Brazil;Federal University of Campina Grande, Brazil

  • Venue:
  • ICPR '06 Proceedings of the 18th International Conference on Pattern Recognition - Volume 03
  • Year:
  • 2006

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Abstract

This paper introduces a classification method based on feature space segmentation. Since the classification task is equivalent to a probability distribution estimation, a Bayesian network is used as an inference mechanism for dealing with the underling probability distribution function that, presumably, is complex and factored. The article presents a method for splitting the feature space into regions that are associated to local classifiers. After that, a Bayesian network is used for combining their outputs. Experimental results reveal that this is a suitable approach for speeding up the training phase for large databases as well as to ensure good recognition rates.