Feature Selection based on the Bhattacharyya Distance

  • Authors:
  • Guorong Xuan;Xiuming Zhu;Peiqi Chai;Zhenping Zhang;Yun Q. Shi;Dongdong Fu

  • Affiliations:
  • Tongji University, Shanghai, China;Tongji University, Shanghai, China;Tongji University, Shanghai, China;Tongji University, Shanghai, China;New Jersey Institute of Technology Newark, NJ;New Jersey Institute of Technology Newark, NJ

  • Venue:
  • ICPR '06 Proceedings of the 18th International Conference on Pattern Recognition - Volume 03
  • Year:
  • 2006

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Abstract

This paper presents a Bhattacharyya distance based feature selection method, which utilizes a recursive algorithm to obtain the optimal dimension reduction matrix in terms of the minimum upper bound of classification error under normal distribution for multi-class classification problem. In our scheme, PCA is incorporated as a pre-processing to reduce the intractably heavy computation burden of the recursive algorithm. The superior experimental results on the handwritten-digit recognition with the MNIST database and the steganalysis applications have demonstrated the effectiveness of our proposed method.