Design Pattern Detection for Reverse Engineering

Authors:
Francesca Arcelli;Claudia Raibulet;Yann-Gael Gueheneuc;Giuliano Antoniol;Jason McC Smith
Affiliations:
Univ. Milano-Bicocca, Italy;Univ. Milano-Bicocca, Italy;Univ. of Montréal, Canada;Polytechnique de Montreal, Canada;IBM Watson Research, USA
Venue:
WCRE '06 Proceedings of the 13th Working Conference on Reverse Engineering
Year:
2006

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Abstract

The main goal of the workshop is to address the issues related to design patterns identification for design recovery focusing on the role of the reverse engineering in identifying the sub-elements of the design patterns that can improve their detection.