The Potential and Limitation of Probability-Based Combinational Equivalence Checking

Authors:
Shih-Chieh Wu;Chun-Yao Wang;Jan-An Hsieh
Affiliations:
National Tsing Hua University, HsinChu, Taiwan R.O.C.;National Tsing Hua University, HsinChu, Taiwan R.O.C.;National Tsing Hua University, HsinChu, Taiwan R.O.C.
Venue:
ATS '06 Proceedings of the 15th Asian Test Symposium
Year:
2006

Citing 0
Cited 1

Novel probabilistic combinational equivalence checking

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract

Power of scan operation is dominant factor. This paper proposed the structure to reduce scan power totally. The total scan power reduction architecture uses a duplicated transition monitoring window and sub-scan chains. Experimental results show 60% ...