Low-Overhead Run-Time Memory Leak Detection and Recovery

Authors:
Timothy Tsai;Kalyan Vaidyanathan;Kenny Gross
Affiliations:
Sun Microsystems, Inc.;Sun Microsystems, Inc.;Sun Microsystems, Inc.
Venue:
PRDC '06 Proceedings of the 12th Pacific Rim International Symposium on Dependable Computing
Year:
2006

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Abstract

In general, the software-testing time may be measured by two kinds of time scales: calendar time and test-execution time. In this paper, we develop two-dimensional software reliability models with two-time measures and incorporate both of them to assess ...