An improved model-based method to test circuit faults

  • Authors:
  • Xiaochun Cheng;Dantong Ouyang;Jiang Yunfei;Chengqi Zhang

  • Affiliations:
  • Software Institute, Northeast Normal University, China and National Laboratory of Symbolic Computation and Knowledge Engineering, Changchun, China;National Laboratory of Symbolic Computation and Knowledge Engineering, Changchun, China and Department of Computer Science and Technology, Jilin University, Changchun, China;National Laboratory of Symbolic Computation and Knowledge Engineering, Changchun, China and Software Institute, Zhongshan University, Guangzhou, China;National Laboratory of Symbolic Computation and Knowledge Engineering, Changchun, China and Faculty of Information Technology, University of Technology, Sydney, Broadway, NSW, Australia

  • Venue:
  • Theoretical Computer Science
  • Year:
  • 2005

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Abstract

This paper presents an improved model-based reasoning method to test circuit faults. The testing procedure is applicable even when the target system contains multiple faulty modes. Using our method, the observation could be planned appropriately to guarantee correct solutions to be in the restricted candidate space. The existent consistency-checking method and abductive reasoning method are special cases of our method. The relationship between the testing procedure and the corresponding prime implication is analyzed for algorithmic implementation.